Badania polimerów z wykorzystaniem metody mikroskopii sił atomowych. Cz. I. Podstawy AFM i jej zastosowanie w badaniach morfologii polimerów

H. Kaczmarek; R. Czajka; M. Nowicki; D. Ołdak

Published : 2022-09-18

Vol. 47 No. 11-12 (2002)

Polymer studies using atomic force microscopy (AFM). Part I. Principles of AFM and its application in polymer morphology investigations

H. Kaczmarek R. Czajka M. Nowicki D. Ołdak

Abstract

On the basis of recent literature data the principles of Atomic Force Microscopy (AFM) and progress in the development of this technique have been reported. Its advantages and shortcomings as well as the possibilities it creates have also been discussed. Application of AFM method for geometric structure of polymer surface determining as well as determining of surface roughness and morphology of polymer blends and copolymers. AFM is especially useful for investigation of the surface defects, impurities, wettability, polymer miscibility, phase separation, selforganized structures and molecular interactions. Owing to FM the influence of polymer surface morphology on the polymer properties (in nanometer scale) can be estimated.

Keywords

mikroskopia sił atomowych AFM ; nanostruktury ; struktura geometryczna powierzchni polimerów ; chropowatość ; morfologia mieszaniny polimerowej ; morfologia i struktura kopolimerów atomic force microscopy (AFM) ; nanostructures ; geometric structure of polymer surface ; roughness ; polymer blends ; morphology ; copolymer structure

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Kaczmarek, H., Czajka, R., Nowicki, M., & Ołdak, D. (2022). Polymer studies using atomic force microscopy (AFM). Part I. Principles of AFM and its application in polymer morphology investigations. Polimery, 47(11-12), 775-783. Retrieved from https://ichp.vot.pl/index.php/p/article/view/2029

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H. Kaczmarek polimery@ichp.pl

Affiliation
Universytet Mikołaja Kopernika, Wydział Chemii, ul. Gagarina 7, 87-100 Toruń, Poland Politechnika Poznańska, Wydział Fizyki Technicznej, Instytut Fizyki, ul. NIeszawska 13A, 61-022 Poznań, Poland

R. Czajka

M. Nowicki

D. Ołdak