Effect of solvents on structural anisotropy of polyaniline thin films

M. Śniechowski; T. Kozik; W. Łużny

doi:10.14314/polimery.2017.855

Published : 2021-01-15

Vol. 62 No. 11-12 (2017)

Effect of solvents on structural anisotropy of polyaniline thin films

M. Śniechowski T. Kozik W. Łużny

DOI: https://doi.org/10.14314/polimery.2017.855

Abstract

X-ray surface diffraction experiments performed on polyaniline/camphorsulfonic acid (PANI/CSA) thin films reveal high anisotropy of the five main crystalline peaks. This anisotropy is different for samples cast from m-cresol and cast from trifluoroacetic acid (TFA). Taking advantage of a recently published crystalline unit cell model, intensity distribution maps are calculated for these two types of samples. The anisotropy is in agreement with experiment, further validating the PANI/CSA model and showing that solvent molecules are not present in the unit cell.

Keywords

polyaniline ; surface diffraction ; simulations ; film anisotropy ; solvent polianilina ; dyfrakcja powierzchniowa ; symulacje ; anizotropia cienkich warstw ; rozpuszczalnik

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Śniechowski, M., Kozik, T., & Łużny, W. (2021). Effect of solvents on structural anisotropy of polyaniline thin films. Polimery, 62(11-12), 855–860. https://doi.org/10.14314/polimery.2017.855

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M. Śniechowski Maciej.Sniechowski@fis.agh.edu.pl

Affiliation
AGH University of Science and Technology, Faculty of Physics and Applied Computer Science, al. Adama Mickiewicza 30, 30-059 Krakow, Poland

T. Kozik

Affiliation
AGH University of Science and Technology, Faculty of Physics and Applied Computer Science, al. Adama Mickiewicza 30, 30-059 Krakow, Poland

W. Łużny

Affiliation
AGH University of Science and Technology, Faculty of Physics and Applied Computer Science, al. Adama Mickiewicza 30, 30-059 Krakow, Poland